TY  - JOUR
A1  - Fischer, Andreas
A1  - Langmann, Jan
A1  - Vöst, Marcel
A1  - Eickerling, Georg
A1  - Scherer, Wolfgang
T1  - HTD2: a single‐crystal X‐ray diffractometer for combined high‐pressure/low‐temperature experiments at laboratory scale
Y1  - 2022-09-29
VL  - 55
IS  - 5
SP  - 1255
EP  - 1266
JF  - Journal of Applied Crystallography
DO  - 10.1107/S160057672200766X
PB  - International Union of Crystallography
N2  - High‐pressure (HP) X‐ray diffraction experiments at low temperature (LT) require dedicated instruments as well as non‐standard sample environments and measuring strategies. This is especially true when helium cryogenic temperatures below 80 K are targeted. Furthermore, only experiments on single‐crystalline samples provide the prerequisites to study subtle structural changes in the p–T phase diagram under extreme LT and HP conditions in greater detail. Due to special hardware requirements, such measurements are usually in the realm of synchrotron beamlines. This contribution describes the design of an LT/HP diffractometer (HTD2) to perform single‐crystal X‐ray diffraction experiments using a laboratory source in the temperature range 400 > T > 2 K while applying pressures of up to 20 GPa.
N2  - The design and operation of a newly commissioned single‐crystal X‐ray diffractometer (HTD2) are presented. The device enables experiments under simultaneous low‐temperature and high‐pressure conditions using a laboratory X‐ray source.
UR  - http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/10353
ER  -