@article{gledocs_11858_00-1735-0000-0001-33F7-4,
author = {Bunge, H. J. and Klein, H. and Wcislak, L. and Garbe, U. and Weiß, W. and Schneider, J. R.},
title = {High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method},
year = {2003},
volume = {35},
number = {3/4},
pages = {253-271},

series = {Textures and Microstructures},
abstract = {In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional orientation location space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.},
note = { \url {http://hdl.handle.net/11858/00-1735-0000-0001-33F7-4}},
}