@article{gledocs_11858_8774,
author = {Liermann, H. P. and Konôpková, Z. and Appel, K. and Prescher, C. and Schropp, A. and Cerantola, V. and Husband, R. J. and McHardy, J. D. and McMahon, M. I. and McWilliams, R. S. and Pépin, C. M. and Mainberger, J. and Roeper, M. and Berghäuser, A. and Damker, H. and Talkovski, P. and Foese, M. and Kujala, N. and Ball, O. B. and Baron, M. A. and Briggs, R. and Bykov, M. and Bykova, E. and Chantel, J. and Coleman, A. L. and Cynn, H. and Dattelbaum, D. and Dresselhaus-Marais, L. E. and Eggert, J. H. and Ehm, L. and Evans, W. J. and Fiquet, G. and Frost, M. and Glazyrin, K. and Goncharov, A. F. and Hwang, H. and Jenei, Zs. and Kim, J.-Y. and Langenhorst, F. and Lee, Y. and Makita, M. and Marquardt, H. and McBride, E. E. and Merkel, S. and Morard, G. and O'Bannon, E. F. and Otzen, C. and Pace, E. J. and Pelka, A. and Pigott, J. S. and Prakapenka, V. B. and Redmer, R. and Sanchez-Valle, C. and Schoelmerich, M. and Speziale, S. and Spiekermann, G. and Sturtevant, B. T. and Toleikis, S. and Velisavljevic, N. and Wilke, M. and Yoo, C.-S. and Baehtz, C. and Zastrau, U. and Strohm, C.},
title = {Novel experimental setup for megahertz X‐ray diffraction in a diamond anvil cell at the High Energy Density (HED) instrument of the European X‐ray Free‐Electron Laser (EuXFEL)},
year = {2021-05-02},
volume = {28},
number = {3},
pages = {688-706},
publisher = {International Union of Crystallography},
publisher = {5 Abbey Square, Chester, Cheshire CH1 2HU, England},

abstract = {The high‐precision X‐ray diffraction setup for work with diamond anvil cells (DACs) in interaction chamber 2 (IC2) of the High Energy Density instrument of the European X‐ray Free‐Electron Laser is described. This includes beamline optics, sample positioning and detector systems located in the multipurpose vacuum chamber. Concepts for pump–probe X‐ray diffraction experiments in the DAC are described and their implementation demonstrated during the First User Community Assisted Commissioning experiment. X‐ray heating and diffraction of Bi under pressure, obtained using 20 fs X‐ray pulses at 17.8 keV and 2.2 MHz repetition, is illustrated through splitting of diffraction peaks, and interpreted employing finite element modeling of the sample chamber in the DAC.},
note = { \url {http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/8774}},
}