Browsing by Subject "X‐ray diffraction"

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Concepts for nondestructive and depth‐resolved X‐ray residual stress analysis in the near‐surface region of nearly single crystalline materials with mosaic structure

Hollmann, Andreas; Meixner, Matthias; Klaus, Manuela; Genzel, Christoph (Journal of Applied Crystallography, 2020-12-02)

Two evaluation concepts for nondestructive depth‐resolved X‐ray residual stress analysis in the near‐surface region of materials with cubic symmetry and nearly single crystalline structure are introduced by simulated ...
Sub‐micrometer focusing setup for high‐pressure crystallography at the Extreme Conditions beamline at PETRA III

Glazyrin, K.; Khandarkhaeva, S.; Fedotenko, T.; Dong, W.; Laniel, D.; Seiboth, F.; Schropp, A.; Garrevoet, J.; Brückner, D.; Falkenberg, G.; Kubec, A.; David, C.; Wendt, M.; Wenz, S.; Dubrovinsky, L.; Dubrovinskaia, N.; Liermann, H.-P. (Journal of Synchrotron Radiation, 2022-04-05)

Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X‐ray diffraction instrumentation in terms of X‐ray flux, focal spot size and sample ...