%0 Journal article
%A Bunge, H. J.
%A Klein, H.
%A Wcislak, L.
%A Garbe, U.
%A Weiß, W.
%A Schneider, J. R.
%T High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method
%R 10.23689/fidgeo-833
%J Textures and Microstructures
%V 35
%N 3/4

%X In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional orientation location space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.
%U http://hdl.handle.net/11858/00-1735-0000-0001-33F7-4
%~  FID GEO-LEO e-docs