Hard X‐ray full‐field nanoimaging using a direct photon‐counting detector
Hagemann, Johannes
Wittwer, Felix
Longo, Elena
Kubec, Adam
Rothkirch, André
David, Christian
Müller, Martin
Greving, Imke
DOI: https://doi.org/10.1107/S1600577522012103
Persistent URL: http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/11512
Wittwer, Felix; 2Deutsches Elektronen-Synchrotron – DESYCenter for X-ray and Nano Science – CXNSNotkestraße 85 Hamburg 22607 Germany
Longo, Elena; 1Helmholtz-Zentrum HereonMax-Planck-Strasse 1 Geesthacht 21502 Germany
Kubec, Adam; 3Paul Scherrer InstitutForschungsstrasse 111 Villigen 5232 Switzerland
Rothkirch, André; 2Deutsches Elektronen-Synchrotron – DESYCenter for X-ray and Nano Science – CXNSNotkestraße 85 Hamburg 22607 Germany
David, Christian; 3Paul Scherrer InstitutForschungsstrasse 111 Villigen 5232 Switzerland
Müller, Martin; 1Helmholtz-Zentrum HereonMax-Planck-Strasse 1 Geesthacht 21502 Germany
Greving, Imke; 1Helmholtz-Zentrum HereonMax-Planck-Strasse 1 Geesthacht 21502 Germany
Abstract
Full‐field X‐ray nanoimaging is a widely used tool in a broad range of scientific areas. In particular, for low‐absorbing biological or medical samples, phase contrast methods have to be considered. Three well established phase contrast methods at the nanoscale are transmission X‐ray microscopy with Zernike phase contrast, near‐field holography and near‐field ptychography. The high spatial resolution, however, often comes with the drawback of a lower signal‐to‐noise ratio and significantly longer scan times, compared with microimaging. In order to tackle these challenges a single‐photon‐counting detector has been implemented at the nanoimaging endstation of the beamline P05 at PETRA III (DESY, Hamburg) operated by Helmholtz‐Zentrum Hereon. Thanks to the long sample‐to‐detector distance available, spatial resolutions of below 100 nm were reached in all three presented nanoimaging techniques. This work shows that a single‐photon‐counting detector in combination with a long sample‐to‐detector distance allows one to increase the time resolution for in situ nanoimaging, while keeping a high signal‐to‐noise level.
A direct photon‐counting detector was used for different nanoimaging phase contrast techniques, increasing the temporal resolution.
Subjects
nanotomographyfull‐field X‐ray microscopy
near‐field holography
near‐field ptychography
Zernike phase contrast
single‐photon‐counting detector
phase contrast