Combining reverse Monte Carlo analysis of X‐ray scattering and extended X‐ray absorption fine structure spectra of very small nanoparticles

Winterer, Markus
Geiß, Jeremias

DOI: https://doi.org/10.1107/S1600576722010858
Persistent URL: http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/10901
Winterer, Markus; Geiß, Jeremias, 2022: Combining reverse Monte Carlo analysis of X‐ray scattering and extended X‐ray absorption fine structure spectra of very small nanoparticles. In: Journal of Applied Crystallography, 56, 1, 103-109, DOI: https://doi.org/10.1107/S1600576722010858. 
 
Geiß, Jeremias; 1University of Duisburg-EssenNanoparticle Process Technology and CENIDE (Center for Nanointegration Duisburg-Essen)Lotharstrasse 1 Duisberg 47057 Germany

Abstract

Finite size effects in partial pair distribution functions generate artefacts in the scattering structure factor and scattering intensity. It is shown how they can be overcome using a binned version of the Debye scattering equation. Accordingly, reverse Monte Carlo simulations are used for very small nanoparticles of LaFeO3 with diameters below 10 nm to simultaneously analyse X‐ray scattering data and extended X‐ray absorption fine structure spectra at the La K and Fe K edges. The structural information obtained is consistent regarding local structure and long‐range order.


Computing scattering intensity using the Debye scattering equation after binning interatomic distances avoids finite size artefacts and is efficient enough for simultaneous refinement of scattering data and extended X‐ray absorption spectra by reverse Monte Carlo simulations.