X‐ray diffraction with micrometre spatial resolution for highly absorbing samples
Wildeis, Anna
Hartmann, Markus
Brandt, Robert
Döhrmann, Ralph
Fevola, Giovanni
Ossig, Christina
Stuckelberger, Michael Elias
Garrevoet, Jan
Falch, Ken Vidar
Galbierz, Vanessa
Falkenberg, Gerald
Modregger, Peter
DOI: https://doi.org/10.1107/S1600577522008025
Persistent URL: http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/10437
Hartmann, Markus; 3University of SiegenMechanical Engineering DepartmentSiegen 57076 Germany
Brandt, Robert; 3University of SiegenMechanical Engineering DepartmentSiegen 57076 Germany
Döhrmann, Ralph; 2Deutsches Elektronen-Synchrotron DESYCenter for X-ray and Nano Science CXNSHamburg 22607 Germany
Fevola, Giovanni; 2Deutsches Elektronen-Synchrotron DESYCenter for X-ray and Nano Science CXNSHamburg 22607 Germany
Ossig, Christina; 2Deutsches Elektronen-Synchrotron DESYCenter for X-ray and Nano Science CXNSHamburg 22607 Germany
Stuckelberger, Michael Elias; 2Deutsches Elektronen-Synchrotron DESYCenter for X-ray and Nano Science CXNSHamburg 22607 Germany
Garrevoet, Jan; 5Deutsches Elektronen-Synchrotron DESYHamburg 22607 Germany
Falch, Ken Vidar; 5Deutsches Elektronen-Synchrotron DESYHamburg 22607 Germany
Galbierz, Vanessa; 5Deutsches Elektronen-Synchrotron DESYHamburg 22607 Germany
Falkenberg, Gerald; 5Deutsches Elektronen-Synchrotron DESYHamburg 22607 Germany
Abstract
X‐ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high‐Z materials by X‐ray fluorescence have been limited due to the utilization of low photon energies. Here, a goniometer‐based setup implemented at the P06 beamline of PETRA III that allows for micrometre spatial resolution with a photon energy of 35 keV and above is reported. A highly focused beam was achieved by using compound refractive lenses, and high‐precision sample manipulation was enabled by a goniometer that allows up to 5D scans (three rotations and two translations). As experimental examples, the determination of local strain variations in martensitic steel samples with micrometre spatial resolution, as well as the simultaneous elemental distribution for high‐Z materials in a thin‐film solar cell, are demonstrated. The proposed approach allows users from the materials‐science community to determine micro‐structural properties even in highly absorbing samples.
A demonstration of high‐resolution micro X‐ray diffraction at high photon energies for highly absorbing samples.