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High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method

Bunge, H. J.
Klein, H.
Wcislak, L.
Garbe, U.
Weiß, W.
Schneider, J. R.
Journal: Textures and Microstructures, 2003
35, 3/4: 253 - 271
DOI: https://doi.org/10.23689/fidgeo-833
Bunge, H. J.; Klein, H.; Wcislak, L.; Garbe, U.; Weiß, W.; Schneider, J. R., 2003: High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method. In: Textures and Microstructures; Vol. 35.2003, No. 3/4, p. 253-271, DOI: 10.23689/fidgeo-833.
 
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  • Abstract
In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional orientation location space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.
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  • Geochemie, Mineralogie, Petrologie [395]
Subjects:
Methodik {Strukturgeologie}
Gefügekunde der Gesteine
Röntgenanalyse {Mineralogie: Kristallographie}
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