dc.contributor.author | Bunge, H. J. | |
dc.contributor.author | Klein, H. | |
dc.contributor.author | Wcislak, L. | |
dc.contributor.author | Garbe, U. | |
dc.contributor.author | Weiß, W. | |
dc.contributor.author | Schneider, J. R. | |
dc.date.accessioned | 2010-11-24T15:58:40Z | |
dc.date.available | 2010-11-24T15:58:40Z | |
dc.date.issued | 2003 | |
dc.identifier.citation | Textures and Microstructures; Vol. 35.2003, No. 3/4, p. 253-271 | |
dc.identifier.uri | http://hdl.handle.net/11858/00-1735-0000-0001-33F7-4 | |
dc.description.abstract | In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional orientation location space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples. | |
dc.format.extent | 18 S. | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | |
dc.relation.ispartofseries | Textures and Microstructures | |
dc.rights.uri | http://e-docs.geo-leo.de/rights | |
dc.subject.ddc | 548 | |
dc.subject.gok | VAE 120 | |
dc.subject.gok | VKA 200 | |
dc.subject.gok | VGA 410 | |
dc.title | High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method | |
dc.type | article | |
dc.subject.gokverbal | Methodik {Strukturgeologie} | |
dc.subject.gokverbal | Gefügekunde der Gesteine | |
dc.subject.gokverbal | Röntgenanalyse {Mineralogie: Kristallographie} | |
dc.bibliographicCitation.volume | 35 | |
dc.bibliographicCitation.issue | 3/4 | |
dc.bibliographicCitation.firstPage | 253 | |
dc.bibliographicCitation.lastPage | 271 | |
dc.identifier.doi | 10.23689/fidgeo-833 | |
dc.identifier.ppn | 571819583 | |
dc.type.version | publishedVersion | |
dc.bibliographicCitation.journal | Textures and Microstructures | |
dc.relation.collection | Geologische Wissenschaften | |
dc.description.type | research | |