• Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals 

      Gradwohl, Kevin-P.; Danilewsky, Andreas N.; Roder, Melissa; Schmidbauer, Martin; Janicskó-Csáthy, József; Gybin, Alexander; Abrosimov, Nikolay; Sumathi, R. Radhakrishnan (Journal of Applied Crystallography, 2020)
      White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is ...