• Automatic bad‐pixel mask maker for X‐ray pixel detectors with application to serial crystallography 

      Sadri, Alireza; Hadian-Jazi, Marjan; Yefanov, Oleksandr; Galchenkova, Marina; Kirkwood, Henry; Mills, Grant; Sikorski, Marcin; Letrun, Romain; de Wijn, Raphael; Vakili, Mohammad; Oberthuer, Dominik; Komadina, Dana; Brehm, Wolfgang; Mancuso, Adrian P.; Carnis, Jerome; Gelisio, Luca; Chapman, Henry N. (Journal of Applied Crystallography, 2022-11-21)
      X‐ray crystallography has witnessed a massive development over the past decade, driven by large increases in the intensity and brightness of X‐ray sources and enabled by employing high‐frame‐rate X‐ray detectors. The ...
    • Crystal diffraction prediction and partiality estimation using Gaussian basis functions 

      Brehm, Wolfgang; White, Thomas; Chapman, Henry N. (Acta Crystallographica Section A, 2023-02-17)
      The recent diversification of macromolecular crystallographic experiments including the use of pink beams, convergent electron diffraction and serial snapshot crystallography has shown the limitations of using the Laue ...
    • pinkIndexer – a universal indexer for pink‐beam X‐ray and electron diffraction snapshots 

      Gevorkov, Yaroslav; Barty, Anton; Brehm, Wolfgang; White, Thomas A.; Tolstikova, Aleksandra; Wiedorn, Max O.; Meents, Alke; Grigat, Rolf-Rainer; Chapman, Henry N.; Yefanov, Oleksandr (Acta Crystallographica Section A, 2020-01-10)
      A crystallographic indexing algorithm, pinkIndexer, is presented for the analysis of snapshot diffraction patterns. It can be used in a variety of contexts including measurements made with a monochromatic radiation source, ...
    • Ptychographic X-ray speckle tracking 

      Morgan, Andrew J.; Quiney, Harry M.; Bajt, Saša; Chapman, Henry N. (Journal of Applied Crystallography, 2020)
      A method is presented for the measurement of the phase gradient of a wavefront by tracking the relative motion of speckles in projection holograms as a sample is scanned across the wavefront. By removing the need to obtain ...
    • speckle-tracking: a software suite for ptychographic X-ray speckle tracking 

      Morgan, Andrew J.; Murray, Kevin T.; Quiney, Harry M.; Bajt, Saša; Chapman, Henry N. (Journal of Applied Crystallography, 2020)
      In recent years, X-ray speckle-tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to their ...
    • XGANDALF – extended gradient descent algorithm for lattice finding 

      Gevorkov, Yaroslav; Yefanov, Oleksandr; Barty, Anton; White, Thomas A.; Mariani, Valerio; Brehm, Wolfgang; Tolstikova, Aleksandra; Grigat, Rolf-Rainer; Chapman, Henry N. (Acta Crystallographica Section A, 2019-08-30)
      Serial crystallography records still diffraction patterns from single, randomly oriented crystals, then merges data from hundreds or thousands of them to form a complete data set. To process the data, the diffraction ...