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    • The anisotropy in the optical constants of quartz crystals for soft X‐rays 

      Andrle, A.; Hönicke, P.; Vinson, J.; Quintanilha, R.; Saadeh, Q.; Heidenreich, S.; Scholze, F.; Soltwisch, V. (Journal of Applied Crystallography, 2021-02-19)
      The refractive index of a y‐cut SiO2 crystal surface is reconstructed from orientation‐dependent soft X‐ray reflectometry measurements in the energy range from 45 to 620 eV. Owing to the anisotropy of the crystal structure ...