• Fast fitting of reflectivity data of growing thin films using neural networks 

      Greco, Alessandro; Starostin, Vladimir; Karapanagiotis, Christos; Hinderhofer, Alexander; Gerlach, Alexander; Pithan, Linus; Liehr, Sascha; Schreiber, Frank; Kowarik, Stefan (Journal of Applied Crystallography, 2019-11-08)
      X‐ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. This study shows how a simple artificial neural network model can be used to ...
    • Machine learning for scattering data: strategies, perspectives and applications to surface scattering 

      Hinderhofer, Alexander; Greco, Alessandro; Starostin, Vladimir; Munteanu, Valentin; Pithan, Linus; Gerlach, Alexander; Schreiber, Frank (Journal of Applied Crystallography, 2023-01-24)
      Machine learning (ML) has received enormous attention in science and beyond. Discussed here are the status, opportunities, challenges and limitations of ML as applied to X‐ray and neutron scattering techniques, with an ...