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    • Fast fitting of reflectivity data of growing thin films using neural networks 

      Greco, Alessandro; Starostin, Vladimir; Karapanagiotis, Christos; Hinderhofer, Alexander; Gerlach, Alexander; Pithan, Linus; Liehr, Sascha; Schreiber, Frank; Kowarik, Stefan (Journal of Applied Crystallography, 2019-11-08)
      X‐ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. This study shows how a simple artificial neural network model can be used to ...