Browsing Geochemie, Mineralogie, Petrologie by Subject "wavefront metrology"

Now showing items 1-2 of 2

    • Ptychographic X-ray speckle tracking 

      Morgan, Andrew J.; Quiney, Harry M.; Bajt, Saša; Chapman, Henry N. (Journal of Applied Crystallography, 2020)
      A method is presented for the measurement of the phase gradient of a wavefront by tracking the relative motion of speckles in projection holograms as a sample is scanned across the wavefront. By removing the need to obtain ...

    • speckle-tracking: a software suite for ptychographic X-ray speckle tracking 

      Morgan, Andrew J.; Murray, Kevin T.; Quiney, Harry M.; Bajt, Saša; Chapman, Henry N. (Journal of Applied Crystallography, 2020)
      In recent years, X-ray speckle-tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to their ...