• High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method 

      Bunge, H. J.; Klein, H.; Wcislak, L.; Garbe, U.; Weiß, W.; Schneider, J. R. (Textures and microstructures, 2003)
      In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved ...