TY - JOUR A1 - Bunge, H. J. A1 - Klein, H. A1 - Wcislak, L. A1 - Garbe, U. A1 - Weiß, W. A1 - Schneider, J. R. T1 - High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method Y1 - 2003 VL - 35 IS - 3/4 SP - 253 EP - 271 JF - Textures and microstructures DO - 10.23689/fidgeo-2663 N2 - In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional orientation location space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples. UR - http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/6976 ER -