TY  - JOUR
A1  - Gradwohl, Kevin-P.
A1  - Danilewsky, Andreas N.
A1  - Roder, Melissa
A1  - Schmidbauer, Martin
A1  - Janicskó-Csáthy, József
A1  - Gybin, Alexander
A1  - Abrosimov, Nikolay
A1  - Sumathi, R. Radhakrishnan
T1  - Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals
Y1  - 2020
VL  - 53
IS  - 4
SP  - 880
EP  - 884
JF  - Journal of Applied Crystallography
DO  - 10.1107/S1600576720005993
DO  - 10.23689/fidgeo-5077
N2  - White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.
UR  - http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/9423
ER  -