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dc.contributor.authorKouankap, Nono Gus D.
dc.contributor.authorSylvestre, Ganno
dc.contributor.editorPhilipp, Sonja
dc.contributor.editorLeiss, Bernd
dc.contributor.editorVollbrecht, Axel
dc.contributor.editorTanner, David
dc.contributor.editorGudmundsson, Agust
dc.date.accessioned2010-11-26T13:21:38Z
dc.date.accessioned2013-01-28T10:20:10Z
dc.date.available2010-11-26T13:21:38Z
dc.date.available2013-01-28T10:20:10Z
dc.date.issued2006-03
dc.identifier.citationPhilipp, S.; Leiss, B; Vollbrecht, A.; Tanner, D.; Gudmundsson, A. (eds.): 11. Symposium "Tektonik, Struktur- und Kristallingeologie"; 2006, Univ.-Verl. Göttingen, p. 116-118
dc.identifier.isbn3-938616-40-7
dc.identifier.urihttp://hdl.handle.net/11858/00-1735-0000-0001-347C-3
dc.description.abstractMicroscopic study is an indispensable step in the determination of the petrographic characteristics of rocks. In Cameroon just like in most developing countries, simple polarizing microscopes of the 20th Century constitute the only available material for macroscopic studies. A major difficulty encountered in the use of these instruments resides in the realisation of photographs of the different parts of the thin section that require illustrations. The technique that has been used upto now has been inefficient and unsatisfactory. Faced with this recurrent situation, we thought of setting up a new, semi-modern, practical and very economical technique for photographing the thin section.
dc.format.mimetypeapplication/pdf
dc.language.isodeu
dc.publisherUniversitätsverlag Göttingen
dc.relation.ispartof11. Symposium "Tektonik, Struktur- und Kristallingeologie"
dc.subject.ddc551
dc.subject.gokVAE 120
dc.subject.gokVGB 400
dc.subject.gokVKA 130
dc.titleA new practical and economical technique for the obtention of high quality thin section photographs with the help of a simple optical microscope
dc.typeanthologyArticle
dc.subject.gokverbalMethodik {Strukturgeologie}
dc.subject.gokverbalOptische Bestimmungsmethoden {Mineralogie}
dc.subject.gokverbalOptische Petrographie
dc.bibliographicCitation.firstPage116
dc.bibliographicCitation.lastPage118
dc.identifier.doi10.23689/fidgeo-1870
dc.type.versionpublishedVersion
dc.subject.freeDünnschliffmikroskopie
dc.subject.freeMikrofotographie
dc.relation.collectionGeologische Wissenschaften
dc.description.typeconference


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