Auflistung Alle Publikationen nach Mitwirkenden "Cios, Grzegorz"
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Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns
Nolze, Gert; Tokarski, Tomasz; Rychłowski, Łukasz; Cios, Grzegorz; Winkelmann, Aimo (Journal of Applied Crystallography, 2021-05-28)A new software is presented for the determination of crystal lattice parameters from the positions and widths of Kikuchi bands in a diffraction pattern. Starting with a single wide‐angle Kikuchi pattern of arbitrary ... -
Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns
Nolze, Gert; Tokarski, Tomasz; Cios, Grzegorz; Winkelmann, Aimo (Journal of Applied Crystallography, 2020)A historical tool for crystallographic analysis is provided by the Hilton net, which can be used for manually surveying the crystal lattice as it is manifested by the Kikuchi bands in a gnomonic projection. For a quantitative ...