Auflistung Alle Publikationen nach Mitwirkenden "Stöcker, Hartmut"
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X-ray diffraction using focused-ion-beam-prepared single crystals
Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C. (Journal of Applied Crystallography, 2020)High-quality single-crystal X-ray diffraction measurements are a prerequisite for obtaining precise and reliable structure data and electron densities. The single crystal should therefore fulfill several conditions, of ...