Auflistung Alle Publikationen nach Schlagwort "X‐ray reflectivity"
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Fast fitting of reflectivity data of growing thin films using neural networks
(Journal of Applied Crystallography, 2019-11-08)X‐ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. This study shows how a simple artificial neural network model can be used to ...