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    • X‐ray diffraction with micrometre spatial resolution for highly absorbing samples 

      Chakrabarti, Prerana; Wildeis, Anna; Hartmann, Markus; Brandt, Robert; Döhrmann, Ralph; Fevola, Giovanni; Ossig, Christina; Stuckelberger, Michael Elias; Garrevoet, Jan; Falch, Ken Vidar; Galbierz, Vanessa; Falkenberg, Gerald; Modregger, Peter (Journal of Synchrotron Radiation, 2022-10-05)
      X‐ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation ...