• In situ neutron diffraction for analysing complex coarse‐grained functional materials 

      Hinterstein, Manuel; Lemos da Silva, Lucas; Knapp, Michael; Schoekel, Alexander; Etter, Martin; Studer, Andrew (Journal of Applied Crystallography, 2023-08-01)

      Complex functional materials play a crucial role in a broad range of energy‐related applications and in general for materials science. Revealing the structural ...

    • X‐SPEC: a 70 eV to 15 keV undulator beamline for X‐ray and electron spectroscopies 

      Weinhardt, Lothar; Steininger, Ralph; Kreikemeyer-Lorenzo, Dagmar; Mangold, Stefan; Hauschild, Dirk; Batchelor, David; Spangenberg, Thomas; Heske, Clemens (Journal of Synchrotron Radiation, 2021-02-10)
      X‐SPEC is a high‐flux spectroscopy beamline at the KIT (Karlsruhe Institute of Technology) Synchrotron for electron and X‐ray spectroscopy featuring a wide photon energy range. The beamline is equipped with a permanent ...